Artificial Radioculide Half-Life Based On Activation Curve

dc.contributor.authorEdward Mubanga
dc.contributor.authorDavies Mubita
dc.contributor.authorBibhuti Bhusan Dash
dc.contributor.authorUtpal Chandra De
dc.contributor.authorSatyendr Singh
dc.contributor.authorSudhansu Shekhar Patra
dc.date.accessioned2026-08-26T12:32:56Z
dc.date.issued2026-02-25
dc.description.abstractAn experiment on the activation properties of an artificial indium foil was conducted at the National Research Tomsk Polytechnic University laboratory. Background particles were first quantified in a gated chamber. A charged indium foil was positioned in the gated chamber, and the released particles were documented as impulses. The mean values of the measurements were determined together with their corresponding errors. A graph of ln A' versus time (t in minutes) was subsequently constructed. The graph's slope was calculated, representing the decay constant. The half-life of the indium foil was subsequently determined. The graph indicates that the average decay constant is 0.0133 min⁻¹ and the mean half-life is 52.2 minutes. The inaccuracy in the average decay constant and mean half-life was determined to be 1.77 × 10⁻³ min⁻¹ and 6.6 minutes, respectively. The decay curve was graphed, depicting the activity of the indium sample over time, revealing a decrease in activity as time progresses.
dc.identifier.urihttps://www.researchgate.net/publication/401237609_Artificial_Radioculide_Half-Life_Based_on_Activation_Curve
dc.identifier.urihttps://repository.kmu.ac.zm/handle/123456789/189
dc.publisherInternational Conference on Intelligent and Innovative Technologies in Computing, Electrical and Electronics (IITCEE)
dc.subjectHalf-life
dc.subjectDecay constant
dc.subjectartificial indium foil
dc.subjectparticle detector
dc.subjectdecay curve
dc.subjectRussian gated chamber
dc.titleArtificial Radioculide Half-Life Based On Activation Curve
dc.typeArticle

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